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Test Data Compression Techniques - A Survey


S.Anandhi,R.Neela,M.Janaki Rani
Abstract

Testing plays a key role in VLSI. The big challenges in testing are test data volume and testing power. By considering a large test data, memory size is increased thereby increasing the cost of testing. Test data downloading time has great influence on the throughput of the Automatic Test Equipment (ATE). Longer test application time is a major problem for a System on Chip (SoC) design testing. Data compression is the emerging solution to these issues in the field of VLSI testing. Various methods of data compression have been proposed by researchers. In this paper, a survey of the available schemes for data compression has been done.

Volume 11 | 05-Special Issue

Pages: 1666-1679