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A Simple Schmitt Trigger Using SecondGeneration Current Controlled Conveyor


Syed Zahiruddin and Avireni Srinivasulu
Abstract

Background: Emerging of semiconductor technology has provided the scope of inventing the new technologies for the analog and signal processing applications. Academicians and researchers have faith on current mode devices than voltage mode devices to satisfy the need for the emerging technologies. The current mode devices are trusted because of its features such as high dynamic range, bandwidth, slew rate and low supply voltages. In current mode devices, the Second Generation Current Controlled Conveyor (CCCII) is prominent because of the advantage of electronic tunability. This ability is due to the presence of intrinsic resistance at its input port X and thus avoids the use of external resistance. Methods/Results: Since from invention in the year 1995, by A. Fabre, the CCCII has several applications in the field of analog and signal processing, such as filters, oscillators and waveform generators. Schmitt trigger using CCCII is renowned because it offers low hysteresis and due to that less delay during output transition. CCCII is a three terminal device, with two input ports X and Y and has an output port Z. Schmitt trigger is proposed in this manuscript which has single CCCII along with only one external connected resistance. The proposed design is tested using PSPICE simulator, OrCAD 16.3 version tool. It has the benefits of low hysteresis, insensitive to the temperature variations and simple circuit. Also, the proposed design is experimentally tested using the ICs CFOA (Current Feedback Operational Amplifier) and OTA (Operational Transconductance Amplifier). Both the results are inline and found matched with the analysis carried out. Conclusion: It can be concluded that the Schmitt trigger proposed using CCCII gives better results with respect to existing methods available in the literature. The elevated merits are determined with respect to the available models in the literature. The design is also tested with respect to the temperature analysis and Montecarlo analysis, which specify the variance and standard deviations are less and attractive. The proposed design is advantageous for monolithic integrated circuit fabrication.

Volume 11 | 07-Special Issue

Pages: 41-48